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Introduction to Scanning Tunneling Microscopy (Monographs on the Physics and Chemistry of Materials)
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Review
"The book Introduction to Scanning Tunneling Microscopy by C. Julian Chen serves as an excellent starting point to familiarize newcomers with the field, and at the same time provides an in-depth account of theoretical and practical aspects of SPM for the more experienced user. In my personal experience it is also very useful as a textbook for teaching single-molecule studies, at both the beginnersâ and the advanced level." -- Journal of Applied Crystallography
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About the Author
C. Julian Chen, Department of Applied Physics and Applied Mathematics, Columbia University, New YorkC. Julian Chen, Department of Applied Physics and Applied Mathematics, Columbia University, New York, USA.Please visit the author's homepage for more information. [add URL as in the HB webpage: http://www.columbia.edu/~jcc2161/]
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Product details
Series: Monographs on the Physics and Chemistry of Materials (Book 64)
Paperback: 488 pages
Publisher: Oxford University Press; 2 edition (February 15, 2016)
Language: English
ISBN-10: 0198754752
ISBN-13: 978-0198754756
Product Dimensions:
9.1 x 1.1 x 6.1 inches
Shipping Weight: 12.6 ounces (View shipping rates and policies)
Average Customer Review:
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Amazon Best Sellers Rank:
#2,716,148 in Books (See Top 100 in Books)
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Introduction to Scanning Tunneling Microscopy (Monographs on the Physics and Chemistry of Materials) PDF
Introduction to Scanning Tunneling Microscopy (Monographs on the Physics and Chemistry of Materials) PDF
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